Introduction

The XF-8100 is EWAI's second generation WDXRF product. It combines superb performance with affordability in a cost effective package to satisfy your WDXRF needs.
Features
● An innovative design that minimizes the distances of the optical path to greatly improve the X-ray detection efficiency of every channel.
● The XF-8100 features a high count rate, and a high performance MCA (multi-channel analyzer), which significantly improves the maximum count rate and extends the linear range of the count rate. Along with the optimized optical path, this feature significantly improves the intensity of each element's characteristic X-ray peaks, which in turn improves analysis precision.
l The XF-8100 uses a peak characteristic detection method to determine peak area instead of a simple integration, which improves system stability.
● A unique Aluminum channel's splitter optic improves the diffraction efficiency of the Aluminum K-lines 2 to 3 times and thus greatly improves the analysis precision of Aluminum.
● The integrated detector module contains the proportional counter tube, high-voltage circuitry, and signal amplification circuitry all in one compact design. This detector module interfaces directly with the MCA. This simple design greatly reduces the number of interconnects needed and thereby reducing the electronic noise, improving the system's resistance to interference and providing greater reliability.
● The analysis environment and conditions, such as environmental temperature, coolant temperature, and coolant flow among others, are all precisely controlled to improve the entire system's reliability.
● The new software interface is more flexible, convenient and intuitive.